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Therefore it is necessary to analyze the reliability of semiconductor lasers for the reliability problems that have emerged design. The stability of laser operation is affected by temperature significantly, which is determined by the laser works, so, in order to stabilize the laser to work, usually on the laser carrier automatic temperature control, to make it stable wavelength and power. For semiconductor lasers affect the reliability and life in addition to temperature and working conditions outside of its own because of the active region high power density and cavity surface degradation. green laser pointer can read the electronic books.
Laser degradation mainly in the form of: reduced light output power, threshold current density increases, reduced efficiency, beam quality deterioration model features 9 Yanbian University undergraduate thesis and PI characteristic changes occur "kink." Material degradation can be divided into two categories within: even occur through degradation of the active region; strong absorption of light and dark, dark line defects point defects. The formation of these defects is the material substrate, epitaxial growth and the introduction of process engineering, but also with the non-radiative electron-hole composite structure due to changes in the microstructure. There are two main end damage: catastrophic end damage, cavity surface-chemical corrosion damage. When the surface of the laser light absorption, the surface recombination current density, a large number of local heating, the temperature and the absorption coefficient increased, forming a vicious cycle, resulting in the catastrophic end damage. green laser pointer is normally varnished with superior oil paint.
Cavity surface-chemical corrosion damage is due to photochemical oxidation of the surface and the formation of point defects in the cavity surface, which causes the local cavity surface reflectance changes, affecting the stability of the lasing light wire position, increased non-radiative recombination rate . Cavity surface-absorbing layer formed oxidation corrosion, so that the laser generated from the pulse. Defects in the substrate and process defects in the stress will lead to the introduction of laser short-term failure. Almost all due to the use of high power laser bare package, environmental cleanup and the atmosphere will affect the quality of life of the laser. The level of the junction temperature is the most direct impact on the life of the laser element, the higher the junction temperature, the shorter working life, it is necessary to reduce the thermal resistance of lasers to improve the photoelectric conversion efficiency. The shooting distance of yellow ray green laser pointer is much shorter.
Lasers, there are three failure modes, DLD dark line defets) (visible optical namely (, VOD damage) and COD (catastrophic optical damage). DLD failure manifested as a sudden stop working or efficiency of the laser decreased, the figure in the near-field performance local non-luminous, and its failure mechanisms are: the substrate or chip processing defects caused by mechanical damage, the laser heat stress during the work role, and gradually extended to the active layer, the formation of non-radiative recombination centers, the laser stops work or efficiency. To avoid such failure, you can take the following approach: use of substrate defect density as low as possible; chip processing to minimize the stress in the storage process, in particular, dicing and P surface metallization process; will designated Area of corrosion chemical etching a groove, so that will make dicing limit mechanical damage caused by lining the bottom. The brightness of yellow ray green laser pointer is relatively much lower.
VOD performance for the laser-cavity surface failure has deposits in the near-field light intensity map showed a slight decrease, the failure mechanism as follows: organic matter occurred in the surface photochemical reaction chamber to form a sediment. Such failure occurs only in a sealed package devices, so this will not be discussed. COD failure in the near-field diagram for the luminous intensity is very weak performance, the performance of the EBIC map pointing to the ground-cavity surface-active area of the "finger-like" damage zone. The failure mechanisms are: a smooth able to withstand the laser power density is limited, when the laser power density exceeds this limit, the laser-cavity surface will be high-temperature melting, the occurrence of the so-called 10 Yanbian University undergraduate thesis, "catastrophic damage . " Green ray green laser pointer is most welcomed in the international market.